@article{ISI:000356819400007,
 abstract = {Patterned substrate growth has been a subject of much interest. In this
work, characteristics of some statistical properties of a film grown on
triangular and vicinal substrates using the Family model are studied.
Substrate size and tilt angle are varied. It is found that the interface
width and the correlation function increase as the roughness of the
pattern is increased. The new scaling exponents are calculated and
anomalous scaling is obtained. The transient persistence probability
does not show a power law relation when the initial surface is
sufficiently rough. The initial rough surface also causes multifractal
behavior in the model.},
 author = {Chanphana, R. and Chatraphorn, P. and Dasgupta, C.},
 doi = {10.1007/s10955-015-1251-8},
 eissn = {1572-9613},
 issn = {0022-4715},
 journal = {JOURNAL OF STATISTICAL PHYSICS},
 month = {JUL},
 number = {2},
 orcid-numbers = {Chanphana, Rangsima/0000-0002-3769-681X
Dasgupta, Chandan/0000-0002-0302-1881},
 pages = {397-408},
 times-cited = {1},
 title = {Effects of Patterned Substrate on Thin Films Simulated by Family Model},
 unique-id = {ISI:000356819400007},
 volume = {160},
 year = {2015}
}