@article{ISI:000257424700053,
 abstract = {We show that the defect density n, for a slow nonlinear power-law quench
with a rate tau(-1) and an exponent alpha > 0, which takes the system
through a critical point characterized by correlation length and
dynamical critical exponents nu and z, scales as n similar to tau(-alpha
nu d/(alpha z nu+1)) [n similar to(alpha g((alpha-1)/alpha)/tau)(nu
d/(z nu+1))] if the quench takes the system across the critical point at
time t=0 [t=t(0)not equal 0], where g is a nonuniversal constant and d
is the system dimension. These scaling laws constitute the first
theoretical results for defect production in nonlinear quenches across
quantum critical points and reproduce their well-known counterpart for a
linear quench (alpha=1) as a special case. We supplement our results
with numerical studies of well-known models and suggest experiments to
test our theory.},
 article-number = {016806},
 author = {Sen, Diptiman and Sengupta, K. and Mondal, Shreyoshi},
 doi = {10.1103/PhysRevLett.101.016806},
 eissn = {1079-7114},
 issn = {0031-9007},
 journal = {PHYSICAL REVIEW LETTERS},
 month = {JUL 4},
 number = {1},
 times-cited = {122},
 title = {Defect production in nonlinear quench across a quantum critical point},
 unique-id = {ISI:000257424700053},
 volume = {101},
 year = {2008}
}