@article{ISI:000184898800040,
 abstract = {We show experimentally and theoretically that the persistence of large
deviations in equilibrium step fluctuations is characterized by an
infinite family of independent exponents. These exponents are obtained
by carefully analyzing dynamical experimental images of Al/Si(111) and
Ag(111) equilibrium steps fluctuating at high (970 K) and low (320 K)
temperatures, respectively, and by quantitatively interpreting our
observations on the basis of the corresponding coarse-grained discrete
and continuum theoretical models for thermal surface step fluctuations
under attachment/detachment (″high-temperature″) and
edge-diffusion limited kinetics (″low-temperature″), respectively.},
 article-number = {086103},
 author = {Constantin, M and Das Sarma, S and Dasgupta, C and Bondarchuk, O and
Dougherty, DB and Williams, ED},
 doi = {10.1103/PhysRevLett.91.086103},
 eissn = {1079-7114},
 issn = {0031-9007},
 journal = {PHYSICAL REVIEW LETTERS},
 month = {AUG 22},
 number = {8},
 orcid-numbers = {Sarma, Sankar Das/0000-0002-0439-986X
Dasgupta, Chandan/0000-0002-0302-1881
Bondarchuk, Oleksandr/0000-0001-7380-8930},
 researcherid-numbers = {Sarma, Sankar Das/B-2400-2009
Dougherty, Daniel/AAA-9562-2019
},
 times-cited = {25},
 title = {Infinite family of persistence exponents for interface fluctuations},
 unique-id = {ISI:000184898800040},
 volume = {91},
 year = {2003}
}