@article{ISI:000178071800033,
 abstract = {The persistence behavior for fluctuating steps on the
Si(111)-(root3xroot3)R30degrees-Al surface was determined by analyzing
time-dependent STM images for temperatures between 770 and 970 K. Using
the standard persistence definition, the measured persistence
probability displays power-law decay with an exponent of
theta=0.77+/-0.03. This is consistent with the value of theta=3/4
predicted for attachment-detachment limited step kinetics. If the
persistence analysis is carried out in terms of return to a
fixed-reference position, the measured probability decays exponentially.
Numerical studies of the Langevin equation used to model step motion
corroborate the experimental observations.},
 article-number = {136102},
 author = {Dougherty, DB and Lyubinetsky, I and Williams, ED and Constantin, M and
Dasgupta, C and Das Sarma, S},
 doi = {10.1103/PhysRevLett.89.136102},
 eissn = {1079-7114},
 issn = {0031-9007},
 journal = {PHYSICAL REVIEW LETTERS},
 month = {SEP 23},
 number = {13},
 orcid-numbers = {Sarma, Sankar Das/0000-0002-0439-986X
Dasgupta, Chandan/0000-0002-0302-1881},
 researcherid-numbers = {Sarma, Sankar Das/B-2400-2009
Dougherty, Daniel/AAA-9562-2019
},
 title = {Experimental persistence probability for fluctuating steps},
 unique-id = {ISI:000178071800033},
 volume = {89},
 year = {2002}
}